| http://dbpedia.org/ontology/abstract
|
Surface metrology is the measurement of sm … Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures. Surface finish may be measured in two ways: contact and non-contact methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers. Non-contact methods include: interferometry, digital holography, confocal microscopy, focus variation, structured light, electrical capacitance, electron microscopy, photogrammetry and non-contact profilometers.togrammetry and non-contact profilometers.
|
| http://dbpedia.org/ontology/thumbnail
|
http://commons.wikimedia.org/wiki/Special:FilePath/Surface_finish_waviness_filter_type.svg?width=300 +
|
| http://dbpedia.org/ontology/wikiPageExternalLink
|
https://nanovea.com/instruments/%3Fp=profilometers +
, http://www.digitalsurf.fr/en/guide.html +
, http://www.gcsca.net/IJ/SurfCharJ.html +
|
| http://dbpedia.org/ontology/wikiPageID
|
2285184
|
| http://dbpedia.org/ontology/wikiPageLength
|
18246
|
| http://dbpedia.org/ontology/wikiPageRevisionID
|
1100789872
|
| http://dbpedia.org/ontology/wikiPageWikiLink
|
http://dbpedia.org/resource/Measurement +
, http://dbpedia.org/resource/Stylus +
, http://dbpedia.org/resource/Fractal_dimension +
, http://dbpedia.org/resource/Fractal +
, http://dbpedia.org/resource/ISO_25178 +
, http://dbpedia.org/resource/Statistics +
, http://dbpedia.org/resource/Interferometry +
, http://dbpedia.org/resource/Scanning_laser_microscope +
, http://dbpedia.org/resource/Category:Metrology +
, http://dbpedia.org/resource/Confocal_chromatic_aberration +
, http://dbpedia.org/resource/File:Rugosimetro_portatile.jpg +
, http://dbpedia.org/resource/Electron_microscopy +
, http://dbpedia.org/resource/Surface_finish +
, http://dbpedia.org/resource/Profilometer +
, http://dbpedia.org/resource/Phonograph +
, http://dbpedia.org/resource/Root_mean_square +
, http://dbpedia.org/resource/Digital_holographic_microscopy +
, http://dbpedia.org/resource/Atomic_force_microscope +
, http://dbpedia.org/resource/ImageJ +
, http://dbpedia.org/resource/Metrology +
, http://dbpedia.org/resource/Structured-light_3D_scanner +
, http://dbpedia.org/resource/Surface_roughness +
, http://dbpedia.org/resource/Confocal_microscopy +
, http://dbpedia.org/resource/Electrical_capacitance +
, http://dbpedia.org/resource/Primary_form +
, http://dbpedia.org/resource/Nyquist%E2%80%93Shannon_sampling_theorem +
, http://dbpedia.org/resource/Photogrammetry +
, http://dbpedia.org/resource/Diamond +
, http://dbpedia.org/resource/Focus_variation +
, http://dbpedia.org/resource/Absolute_value +
, http://dbpedia.org/resource/Coherence_scanning_interferometry +
, http://dbpedia.org/resource/Arithmetic_average +
, http://dbpedia.org/resource/Structured_light +
, http://dbpedia.org/resource/Kurtosis +
, http://dbpedia.org/resource/Skewness +
|
| http://dbpedia.org/property/wikiPageUsesTemplate
|
http://dbpedia.org/resource/Template:Further +
, http://dbpedia.org/resource/Template:Annotated_link +
, http://dbpedia.org/resource/Template:Reflist +
, http://dbpedia.org/resource/Template:Short_description +
, http://dbpedia.org/resource/Template:For +
, http://dbpedia.org/resource/Template:Main +
, http://dbpedia.org/resource/Template:%21 +
, http://dbpedia.org/resource/Template:See_also +
, http://dbpedia.org/resource/Template:Clarify +
|
| http://purl.org/dc/terms/subject
|
http://dbpedia.org/resource/Category:Metrology +
|
| http://purl.org/linguistics/gold/hypernym
|
http://dbpedia.org/resource/Measurement +
|
| http://www.w3.org/ns/prov#wasDerivedFrom
|
http://en.wikipedia.org/wiki/Surface_metrology?oldid=1100789872&ns=0 +
|
| http://xmlns.com/foaf/0.1/depiction
|
http://commons.wikimedia.org/wiki/Special:FilePath/Rugosimetro_portatile.jpg +
, http://commons.wikimedia.org/wiki/Special:FilePath/Surface_finish_form_waviness_roughness.svg +
, http://commons.wikimedia.org/wiki/Special:FilePath/Surface_finish_waviness_filter_frequency.svg +
, http://commons.wikimedia.org/wiki/Special:FilePath/Surface_finish_form_removal.svg +
, http://commons.wikimedia.org/wiki/Special:FilePath/Surface_finish_waviness_filter_type.svg +
|
| http://xmlns.com/foaf/0.1/isPrimaryTopicOf
|
http://en.wikipedia.org/wiki/Surface_metrology +
|
| owl:sameAs |
http://www.wikidata.org/entity/Q7645991 +
, https://global.dbpedia.org/id/4vDbX +
, http://rdf.freebase.com/ns/m.070x4h +
, http://dbpedia.org/resource/Surface_metrology +
, http://fa.dbpedia.org/resource/%D9%85%D8%AA%D8%B1%D9%88%D9%84%D9%88%DA%98%DB%8C_%D8%B3%D8%B7%D8%AD +
|
| rdf:type |
http://dbpedia.org/ontology/Company +
|
| rdfs:comment |
Surface metrology is the measurement of sm … Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures.must operate with high internal pressures.
|
| rdfs:label |
Surface metrology
|
| rdfs:seeAlso |
http://dbpedia.org/resource/Profilometer +
|
