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A microscopia Kelvin (KPFM – Kelvin probe … A microscopia Kelvin (KPFM – Kelvin probe force microscopy) ou também chamada microscopia de potencial de superfície proposta por Nonnermacher em 1991, é uma técnica de resolução atômica e nanométrica sendo uma variante da microscopia de força atômica onde um cantilever metalizado é capaz de medir a diferença de potencial entre a ponteira nele contido e a superfície da amostra. Através desta medição, pode-se obter a função trabalho característica de cada átomo da superfície da amostra o que dá a exata composição em nível atômico da superfície da amostra. Através do conhecimento da função trabalho da superfície da amostra, várias aplicações são possíveis, desde reconstrução de superfícies uma vez que o mapeamento da mesma permitirá detectar defeitos, detecção de corrosão uma vez que a função trabalho dos átomos de moléculas resultantes de tal fenômeno serão diferentes da função dos átomos da superfície ideal, aplicações semicondutoras e detecção de cargas aprisionadas em dielétricos. Aplicações biológicas também são possíveis, como por exemplo, a obtenção de topografia e do potencial de superfície de uma única molécula de DNA conforme citado nas seções adiantes.e DNA conforme citado nas seções adiantes.
, Die Raster-Kelvin-Mikroskopie (oft KPFM od … Die Raster-Kelvin-Mikroskopie (oft KPFM oder KFM abgekürzt vom englischen Begriff Kelvin (Probe) Force Microscopy, manchmal auch SKPM – Scanning Kelvin Probe Microscopy) ist ein Verfahren zur Messung des lokal aufgelösten einer Probe. Entwickelt wurde die von der Rasterkraftmikroskopie (AFM) weiterentwickelte Messmethode durch Nonnenmacher, O’Boyle und Wickramasinghe in den 1990er Jahren. Neben klassischen materialwissenschaftlichen Fragestellungen wie z. B. im Bereich der Solarzellenentwicklung oder Korrosionsforschung wird KPFM inzwischen auch mehr und mehr im Bereich der Biologie angewendet.d mehr im Bereich der Biologie angewendet.
, Kelvin probe force microscopy (KPFM), also … Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can be observed at atomic or molecular scales. The work function relates to many surface phenomena, including catalytic activity, reconstruction of surfaces, doping and band-bending of semiconductors, charge trapping in dielectrics and corrosion. The map of the work function produced by KPFM gives information about the composition and electronic state of the local structures on the surface of a solid.ocal structures on the surface of a solid.
, 开尔文探针力显微鏡（Kelvin probe force microscope, KPFM）是一種原子力顯微鏡，於1991年問世。开尔文探针力显微鏡利用微懸臂感受和放大懸臂上尖細探針與受測樣品原子之間的作用力，從而達到檢測的目的，具有原子級的分辨率。
, ケルビンプローブフォース顕微鏡（ケルビンプローブフォースけんびきょう、英: Kelvin probe Force Microscopy: KFM）は、原子間力顕微鏡 (AFM) を元に開発された顕微鏡の一種。イギリスのケルビン卿が接触電位差として短針と試料との電位差が得られることを発見した事が名前の由来となっている。
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Why electron flow from the lower to the higher fermi level? Usually the electron flow is in the direction to the lower fermi level so that the energy is minimized, see e.g. https://www.britannica.com/science/Fermi-level
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ケルビンプローブフォース顕微鏡（ケルビンプローブフォースけんびきょう、英: Kelvin probe Force Microscopy: KFM）は、原子間力顕微鏡 (AFM) を元に開発された顕微鏡の一種。イギリスのケルビン卿が接触電位差として短針と試料との電位差が得られることを発見した事が名前の由来となっている。
, Die Raster-Kelvin-Mikroskopie (oft KPFM od … Die Raster-Kelvin-Mikroskopie (oft KPFM oder KFM abgekürzt vom englischen Begriff Kelvin (Probe) Force Microscopy, manchmal auch SKPM – Scanning Kelvin Probe Microscopy) ist ein Verfahren zur Messung des lokal aufgelösten einer Probe. Entwickelt wurde die von der Rasterkraftmikroskopie (AFM) weiterentwickelte Messmethode durch Nonnenmacher, O’Boyle und Wickramasinghe in den 1990er Jahren. Neben klassischen materialwissenschaftlichen Fragestellungen wie z. B. im Bereich der Solarzellenentwicklung oder Korrosionsforschung wird KPFM inzwischen auch mehr und mehr im Bereich der Biologie angewendet.d mehr im Bereich der Biologie angewendet.
, 开尔文探针力显微鏡（Kelvin probe force microscope, KPFM）是一種原子力顯微鏡，於1991年問世。开尔文探针力显微鏡利用微懸臂感受和放大懸臂上尖細探針與受測樣品原子之間的作用力，從而達到檢測的目的，具有原子級的分辨率。
, A microscopia Kelvin (KPFM – Kelvin probe … A microscopia Kelvin (KPFM – Kelvin probe force microscopy) ou também chamada microscopia de potencial de superfície proposta por Nonnermacher em 1991, é uma técnica de resolução atômica e nanométrica sendo uma variante da microscopia de força atômica onde um cantilever metalizado é capaz de medir a diferença de potencial entre a ponteira nele contido e a superfície da amostra. Através desta medição, pode-se obter a função trabalho característica de cada átomo da superfície da amostra o que dá a exata composição em nível atômico da superfície da amostra.em nível atômico da superfície da amostra.
, Kelvin probe force microscopy (KPFM), also … Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings.ly used to measure corrosion and coatings.
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| rdfs:label |
Microscopia kelvin
, ケルビンプローブフォース顕微鏡
, Kelvin probe force microscope
, Raster-Kelvin-Mikroskopie
, 开尔文探针力显微鏡
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