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http://purl.org/net/nknouf/ns/bibtex#Article +
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https://dblp.org/pid/256/3030 +
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https://dblp.org/rdf/schema#documentPage
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https://doi.org/10.1109/TIE.2020.3018056 +
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https://dblp.org/rdf/schema#doi
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https://doi.org/10.1109/TIE.2020.3018056 +
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https://dblp.org/db/journals/tie/tie68 +
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7
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https://dblp.org/rdf/schema#pagination
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8863-8873
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https://dblp.org/rdf/schema#primaryDocumentPage
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https://doi.org/10.1109/TIE.2020.3018056 +
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https://dblp.org/rdf/schema#publishedIn
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IEEE Trans. Ind. Electron.
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https://dblp.org/rdf/schema#publishedInJournal
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IEEE Trans. Ind. Electron.
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https://dblp.org/rdf/schema#publishedInJournalVolume
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68
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https://dblp.org/rdf/schema#publishedInJournalVolumeIssue
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9
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https://dblp.org/rdf/schema#publishedInStream
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https://dblp.org/streams/journals/tie +
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https://dblp.org/rdf/schema#title
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SAW Tags With Enhanced Penetration Depth for Buried Assets Identification (Aug. 2020).
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https://dblp.org/rdf/schema#yearOfPublication
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2021
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https://doi.org/10.1109/TIE.2020.3018056 +
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Ruchuan Shi et al.: SAW Tags With Enhanced Penetration Depth for Buried Assets Identification (Aug. 2020). (2021)
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