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Https://dblp.org/rec/journals/tcad/PanthSSDL17
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https://dblp.org/rec/journals/tcad/PanthSSDL17
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https://dblp.org/rdf/schema#documentPage https://doi.org/10.1109/TCAD.2017.2681064 +
https://dblp.org/rdf/schema#doi https://doi.org/10.1109/TCAD.2017.2681064 + , http://dx.doi.org/10.1109/TCAD.2017.2681064 +
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https://dblp.org/rdf/schema#numberOfCreators 5
https://dblp.org/rdf/schema#pagination 1265-1273
https://dblp.org/rdf/schema#primaryDocumentPage https://doi.org/10.1109/TCAD.2017.2681064 +
https://dblp.org/rdf/schema#publishedIn IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
https://dblp.org/rdf/schema#publishedInJournal IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
https://dblp.org/rdf/schema#publishedInJournalVolume 36
https://dblp.org/rdf/schema#publishedInJournalVolumeIssue 8
https://dblp.org/rdf/schema#title Tier Degradation of Monolithic 3-D ICs: A Power Performance Study at Different Technology Nodes.
https://dblp.org/rdf/schema#yearOfPublication 2017
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rdfs:label Shreepad Panth et al.: Tier Degradation of Monolithic 3-D ICs: A Power Performance Study at Different Technology Nodes. (2017)
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