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Https://dblp.org/rec/journals/qre/ParkPM23
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https://dblp.org/rec/journals/qre/ParkPM23
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https://dblp.org/rdf/schema#documentPage https://doi.org/10.1002/QRE.3217 +
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https://dblp.org/rdf/schema#publishedIn Qual. Reliab. Eng. Int.
https://dblp.org/rdf/schema#publishedInJournal Qual. Reliab. Eng. Int.
https://dblp.org/rdf/schema#publishedInJournalVolume 39
https://dblp.org/rdf/schema#publishedInJournalVolumeIssue 1
https://dblp.org/rdf/schema#title A novel hybrid resampling for semiconductor wafer defect bin classification.
https://dblp.org/rdf/schema#yearOfPublication 2023
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rdfs:label You-Jin Park et al.: A novel hybrid resampling for semiconductor wafer defect bin classification. (2023)
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