| https://dblp.org/rdf/schema#authoredBy
|
https://dblp.org/pid/16/4053 +
, https://dblp.org/pid/44/8371 +
, https://dblp.org/pid/47/4072 +
, https://dblp.org/pid/328/7128 +
, https://dblp.org/pid/70/1940 +
, https://dblp.org/pid/73/404 +
, https://dblp.org/pid/89/3948 +
, https://dblp.org/pid/99/315 +
|
| https://dblp.org/rdf/schema#bibtexType
|
http://purl.org/net/nknouf/ns/bibtex#Article +
|
| https://dblp.org/rdf/schema#documentPage
|
https://doi.org/10.1016/S0026-2714%2803%2900063-5 +
|
| https://dblp.org/rdf/schema#doi
|
https://doi.org/10.1016/S0026-2714%2803%2900063-5 +
, http://dx.doi.org/10.1016/S0026-2714%2803%2900063-5 +
|
| https://dblp.org/rdf/schema#listedOnTocPage
|
https://dblp.org/db/journals/mr/mr43 +
|
| https://dblp.org/rdf/schema#numberOfCreators
|
8
|
| https://dblp.org/rdf/schema#pagination
|
981-984
|
| https://dblp.org/rdf/schema#primaryDocumentPage
|
https://doi.org/10.1016/S0026-2714%2803%2900063-5 +
|
| https://dblp.org/rdf/schema#publishedIn
|
Microelectron. Reliab.
|
| https://dblp.org/rdf/schema#publishedInJournal
|
Microelectron. Reliab.
|
| https://dblp.org/rdf/schema#publishedInJournalVolume
|
43
|
| https://dblp.org/rdf/schema#publishedInJournalVolumeIssue
|
6
|
| https://dblp.org/rdf/schema#title
|
The radiation sensitivity mapping of ICs using an IR pulsed laser system.
|
| https://dblp.org/rdf/schema#yearOfPublication
|
2003
|
| owl:sameAs |
https://doi.org/10.1016/S0026-2714%2803%2900063-5 +
, http://dx.doi.org/10.1016/S0026-2714%2803%2900063-5 +
|
| rdf:type |
https://dblp.org/rdf/schema#Publication +
, https://dblp.org/rdf/schema#Article +
|
| rdfs:label |
Ali Behcet Alpat et al.: The radiation sensitivity mapping of ICs using an IR pulsed laser system. (2003)
|
