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Https://dblp.org/rec/conf/itc/MurrayDR83 |
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https://dblp.org/rec/conf/itc/MurrayDR83 |
https://dblp.org/rdf/schema#authoredBy | https://dblp.org/pid/51/5244 + , https://dblp.org/pid/11/528 + , https://dblp.org/pid/70/288 + |
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https://dblp.org/rdf/schema#bibtexType | http://purl.org/net/nknouf/ns/bibtex#Inproceedings + |
https://dblp.org/rdf/schema#listedOnTocPage | https://dblp.org/db/conf/itc/itc1983 + |
https://dblp.org/rdf/schema#numberOfCreators | 3 |
https://dblp.org/rdf/schema#pagination | 260-268 |
https://dblp.org/rdf/schema#publishedAsPartOf | https://dblp.org/rec/conf/itc/1983 + |
https://dblp.org/rdf/schema#publishedIn | ITC |
https://dblp.org/rdf/schema#publishedInBook | ITC |
https://dblp.org/rdf/schema#title | Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost. |
https://dblp.org/rdf/schema#yearOfEvent | 1983 |
https://dblp.org/rdf/schema#yearOfPublication | 1983 |
rdf:type | https://dblp.org/rdf/schema#Publication + , https://dblp.org/rdf/schema#Inproceedings + |
rdfs:label | Alan F. Murray et al.: Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost. (1983) |
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