| http://dbpedia.org/ontology/abstract
|
Terahertz nondestructive evaluation pertai … Terahertz nondestructive evaluation pertains to devices, and techniques of analysis occurring in the terahertz domain of electromagnetic radiation. These devices and techniques evaluate the properties of a material, component or system without causing damage.omponent or system without causing damage.
, 太赫兹无损检测（Terahertz nondestructive evaluatio … 太赫兹无损检测（Terahertz nondestructive evaluation），是一種應用太赫波域电磁辐射设备進行檢測、分析及评估的技術。这些装置和技术可用來评估材料、元件或系统的性质，而不会對它們造成损伤。 太赫兹成像是一種新兴和受到重視的无损检测技术。在制药、生物医学、安全、材料科學及航空航天等行业裡，用于电介质（不导通，即绝缘体）材料分析和质量控制。它已經被證實可以有效檢查顏料與被覆的分層 、偵測陶磁與複合材料的缺陷，以及斷層掃瞄画作與手稿的物理结构。使用THz波於非破坏性评估，可進行多层结构体的检查，并能识别异物、夹杂物、脱粘分层、机械冲击破坏、热损伤异常和水或液压流体的侵入。检查，并能识别异物、夹杂物、脱粘分层、机械冲击破坏、热损伤异常和水或液压流体的侵入。
|
| http://dbpedia.org/ontology/thumbnail
|
http://commons.wikimedia.org/wiki/Special:FilePath/XRay-Optical-THz-IC.gif?width=300 +
|
| http://dbpedia.org/ontology/wikiPageExternalLink
|
http://www.ceb.cam.ac.uk/pages/research-activities.html +
, https://web.archive.org/web/20111005162448/http:/www.ceb.cam.ac.uk/pages/research-activities.html +
, https://apps.dtic.mil/sti/pdfs/ADA491327.pdf +
, http://spie.org/x48321.xml%3Fhighlight=x2412&ArticleID=x48321%7Cyear=2011%7Clast1=Hosako%7Cfirst1=Iwao%7Clast2=Oda%7Cfirst2=Naoki%7Cjournal=SPIE +
, https://zenodo.org/record/1259241 +
|
| http://dbpedia.org/ontology/wikiPageID
|
32185806
|
| http://dbpedia.org/ontology/wikiPageLength
|
18968
|
| http://dbpedia.org/ontology/wikiPageRevisionID
|
1122166193
|
| http://dbpedia.org/ontology/wikiPageWikiLink
|
http://dbpedia.org/resource/Aerospace +
, http://dbpedia.org/resource/Destructive_testing +
, http://dbpedia.org/resource/Electromagnetic_radiation +
, http://dbpedia.org/resource/Ceramic +
, http://dbpedia.org/resource/Space_Shuttle_external_tank +
, http://dbpedia.org/resource/Polystyrene_foam +
, http://dbpedia.org/resource/Shuttle_Columbia +
, http://dbpedia.org/resource/Electromagnetic_wave +
, http://dbpedia.org/resource/Density_meter +
, http://dbpedia.org/resource/Launch_pad +
, http://dbpedia.org/resource/Inspection +
, http://dbpedia.org/resource/Foam_shedding +
, http://dbpedia.org/resource/File:XRay-Optical-THz-IC.gif +
, http://dbpedia.org/resource/Stress_testing +
, http://dbpedia.org/resource/Space_Shuttle +
, http://dbpedia.org/resource/Geophysical_imaging +
, http://dbpedia.org/resource/Category:Terahertz_technology +
, http://dbpedia.org/resource/Nondestructive_testing +
, http://dbpedia.org/resource/Heat +
, http://dbpedia.org/resource/Hail +
, http://dbpedia.org/resource/Thickness_gauge +
, http://dbpedia.org/resource/Tomography +
, http://dbpedia.org/resource/Density +
, http://dbpedia.org/resource/Reliability_engineering +
, http://dbpedia.org/resource/Risk-based_inspection +
, http://dbpedia.org/resource/Composite_materials +
, http://dbpedia.org/resource/Category:Materials_testing +
, http://dbpedia.org/resource/Space_Shuttle_Discovery +
, http://dbpedia.org/resource/Maintenance_testing +
, http://dbpedia.org/resource/Space_Shuttle_Columbia_disaster +
, http://dbpedia.org/resource/Terahertz_radiation +
, http://dbpedia.org/resource/Nondestructive_evaluation +
, http://dbpedia.org/resource/STS-114 +
, http://dbpedia.org/resource/Optical_thickness +
, http://dbpedia.org/resource/Category:Nondestructive_testing +
, http://dbpedia.org/resource/Terahertz_metamaterials +
, http://dbpedia.org/resource/Quality_control +
, http://dbpedia.org/resource/Materials_science +
, http://dbpedia.org/resource/Insulator_%28electrical%29 +
, http://dbpedia.org/resource/NASA +
, http://dbpedia.org/resource/Plastic +
, http://dbpedia.org/resource/Microstructure +
, http://dbpedia.org/resource/Product_certification +
, http://dbpedia.org/resource/Dielectric +
, http://dbpedia.org/resource/Category:Materials_science +
, http://dbpedia.org/resource/Composite_material +
, http://dbpedia.org/resource/Failure_analysis +
, http://dbpedia.org/resource/Forensic_engineering +
, http://dbpedia.org/resource/Insulator_%28electricity%29 +
, http://dbpedia.org/resource/Ultrasonic_testing +
, http://dbpedia.org/resource/Liquid-coupled +
, http://dbpedia.org/resource/Eastern_Time_Zone +
, http://dbpedia.org/resource/Biomedical +
, http://dbpedia.org/resource/Columbia_Accident_Investigation_Board +
, http://dbpedia.org/resource/Predictive_maintenance +
|
| http://dbpedia.org/property/wikiPageUsesTemplate
|
http://dbpedia.org/resource/Template:Colbegin +
, http://dbpedia.org/resource/Template:Colend +
, http://dbpedia.org/resource/Template:Cite_web +
, http://dbpedia.org/resource/Template:Cite_journal +
, http://dbpedia.org/resource/Template:Reflist +
|
| http://purl.org/dc/terms/subject
|
http://dbpedia.org/resource/Category:Materials_testing +
, http://dbpedia.org/resource/Category:Materials_science +
, http://dbpedia.org/resource/Category:Terahertz_technology +
, http://dbpedia.org/resource/Category:Nondestructive_testing +
|
| http://www.w3.org/ns/prov#wasDerivedFrom
|
http://en.wikipedia.org/wiki/Terahertz_nondestructive_evaluation?oldid=1122166193&ns=0 +
|
| http://xmlns.com/foaf/0.1/depiction
|
http://commons.wikimedia.org/wiki/Special:FilePath/XRay-Optical-THz-IC.gif +
|
| http://xmlns.com/foaf/0.1/isPrimaryTopicOf
|
http://en.wikipedia.org/wiki/Terahertz_nondestructive_evaluation +
|
| owl:sameAs |
http://rdf.freebase.com/ns/m.0gxz8sf +
, http://zh.dbpedia.org/resource/%E5%A4%AA%E8%B5%AB%E5%85%B9%E6%97%A0%E6%8D%9F%E6%A3%80%E6%B5%8B +
, http://fa.dbpedia.org/resource/%D8%A2%D8%B2%D9%85%D9%88%D9%86_%D8%AA%D8%B1%D8%A7%D9%87%D8%B1%D8%AA%D8%B2 +
, http://yago-knowledge.org/resource/Terahertz_nondestructive_evaluation +
, https://global.dbpedia.org/id/4nTbJ +
, http://dbpedia.org/resource/Terahertz_nondestructive_evaluation +
, http://www.wikidata.org/entity/Q5962133 +
|
| rdf:type |
http://dbpedia.org/class/yago/Ability105616246 +
, http://dbpedia.org/class/yago/PsychologicalFeature100023100 +
, http://dbpedia.org/class/yago/WikicatEvaluationMethods +
, http://dbpedia.org/class/yago/Know-how105616786 +
, http://dbpedia.org/class/yago/Method105660268 +
, http://dbpedia.org/class/yago/Cognition100023271 +
, http://dbpedia.org/class/yago/Abstraction100002137 +
|
| rdfs:comment |
Terahertz nondestructive evaluation pertai … Terahertz nondestructive evaluation pertains to devices, and techniques of analysis occurring in the terahertz domain of electromagnetic radiation. These devices and techniques evaluate the properties of a material, component or system without causing damage.omponent or system without causing damage.
, 太赫兹无损检测（Terahertz nondestructive evaluatio … 太赫兹无损检测（Terahertz nondestructive evaluation），是一種應用太赫波域电磁辐射设备進行檢測、分析及评估的技術。这些装置和技术可用來评估材料、元件或系统的性质，而不会對它們造成损伤。 太赫兹成像是一種新兴和受到重視的无损检测技术。在制药、生物医学、安全、材料科學及航空航天等行业裡，用于电介质（不导通，即绝缘体）材料分析和质量控制。它已經被證實可以有效檢查顏料與被覆的分層 、偵測陶磁與複合材料的缺陷，以及斷層掃瞄画作與手稿的物理结构。使用THz波於非破坏性评估，可進行多层结构体的检查，并能识别异物、夹杂物、脱粘分层、机械冲击破坏、热损伤异常和水或液压流体的侵入。检查，并能识别异物、夹杂物、脱粘分层、机械冲击破坏、热损伤异常和水或液压流体的侵入。
|
| rdfs:label |
Terahertz nondestructive evaluation
, 太赫兹无损检测
|
